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Reference for the analytical method
| Author | Baedecker, Philip A., editor |
|---|---|
| Year | 1987 |
| Title | Methods for geochemical analysis |
| Series | U.S. Geological Survey Bulletin |
| Issue | 1770 |
| Pages | 1 v.: ill.; 28 cm |
| URL | http://pubs.er.usgs.gov/publication/b1770 |
| Notes | Includes bibliographies. Analytical methods used in the Geologic Division laboratories of the U.S. Geological Survey for the inorganic chemical analysis of rock and mineral samples. |
| Organization | USGS-BAL |
Other parameters measuring Si:
| Parameter | Description |
|---|---|
| Si_pct_AES_SF | Silicon, in weight percent, by inductively coupled plasma-atomic emission spectroscopy after sinter or fusion digestion. |
| Si_pct_CM | Silicon, in weight percent, by colorimetry. |
| Si_pct_ES | Silicon, in weight percent, by semi-quant direct-current arc emission spectrography. |
| Si_pct_ES_Q | Silicon, in weight percent, by quant direct-current arc emission spectrography. |
| Si_pct_GV | Silicon, in weight percent, by gravimetry. |
| Si_pct_WDX | Silicon, in weight percent, by wavelength-dispersive X-ray fluorescence spectroscopy. |
U.S. Department of the Interior |
U.S. Geological Survey
URL: http://mrdata.usgs.gov/agdb/parameter.php?parameter=Si_pct_GV
Page Contact Information: pschweitzer@usgs.gov
Page Last modified: 13:42 on 06-Apr-2012
