Mineral Resources On-Line Spatial Data
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Sumbol < = the element was detected by the technique but at a level below the lower limit of determination for the method. The value of the lower limit of determination is given in the accompanying data field.
Symbol > = the element was measured at a concentration greater than the upper limit of determination for the method. The value of the upper limit of determination is given in the accompanying data field.
Symbol N = the element was measured at a concentration less than the lower limit of determination for the method. The value of the lower limit of determination is given in the accompanying data field.
Symbol B = the element was requested for analysis by the sample submitter, but for some reason the laboratories did not analyze for this element.
When appropriate, these qualifying values appear in this dataset as a separate field preceding each element. The attribute, or field name, for the qualifying values field are always labelled Q. For example, "<" in the "Si_Q" field preceding an analytical data field labelled Si would indicate the actual concentration of silicon is less than the data value listed.
Arbogast, B.F., editor, 1990, Quality assurance manual for the Branch of Geochemistry: U.S. Geological Survey Open-File Report 90-668.
Baedecker, P.A., editor, 1987, Methods of geochemical analysis: U.S. Geological Survey Bulletin 1770.
USGS DDS-47 was used to generate the sediment data set. The GSSEARCH software accompanying DDS-47 was used to retrieve all sample media labeled as "unconsolidated sediment" from the CD and was stored in ASCII format. Another program contained on DDS-47 was used to convert the ASCII file to a .dbf file. This file contains data for a total of 79,709 sediment samples. However, the total number of records in the file is 127,288. This is because each sediment sample analyzed by more than one analytical technique has a separate record for each technique. Thus, one sediment sample may be listed several times.
The following codes are used to represent the analytical methods:
WX = wavelength dispersive X-ray fluorescence analysis EX = energy dispersive X-ray fluorescence analysis SQ = semiquantitative spectro-analysis QS = quantitative spectro-analysis IN = instrumental neutron activation analysis AA = flame and graphite furnace atomic absorption analysis CH = miscellaneous chemical analysis DN = delayed neutron anaysis MS = inductively coupled plasma - mass spectrographic analysisNote that many of the samples have no analytical method identified. This is a shortcoming of the PLUTO database.The PLUTO DBF file was imported into ArcView 3.2 and an ArcView shapefile was generated which contained 127,288 sample locations.