AGDB measured parameter: SiO2_pct_ES_Q

Silicon, as silicon dioxide, in weight percent, by quantitative direct-current arc emission spectrography

Reference for the analytical method

Author Baedecker, Philip A., editor
Year 1987
Title Methods for geochemical analysis
Series Bulletin
Issue 1770
Pages 1 v.: ill.; 28 cm
URL http://pubs.er.usgs.gov/publication/b1770
Notes Includes bibliographies. Analytical methods used in the Geologic Division laboratories of the U.S. Geological Survey for the inorganic chemical analysis of rock and mineral samples.
Organization USGS-BAL

Other parameters measuring SiO2

Parameter Description
SiO2_pct_AES_Fuse Silicon, as silicon dioxide, in weight percent, by inductively coupled plasma-atomic emission spectroscopy after LiBO2 or LiBO2-Li2B4O7 fusion
SiO2_pct_AES_HF Silicon, as silicon dioxide, in weight percent, by inductively coupled plasma-atomic emission spectroscopy after HF-HCl-HNO3-HClO4 digestion
SiO2_pct_AES_ST Silicon, as silicon dioxide, in weight percent, by inductively coupled plasma-atomic emission spectroscopy after Na2O2 sinter digestion
SiO2_pct_CM_Fuse Silicon, as silicon dioxide, in weight percent, by spectrophotometry after NaOH or LiBO2-Li2B4O7 fusion
SiO2_pct_ES_Q Silicon, as silicon dioxide, in weight percent, by quantitative direct-current arc emission spectrography
SiO2_pct_ES_SQ Silicon, as silicon dioxide, in weight percent, by semi-quantitative visual 6-step or direct reader direct-current arc emission spectrography
SiO2_pct_GV_Fuse Silicon, as silicon dioxide, in weight percent, by gravimetric classic or standard rock analysis after fusion digestion
SiO2_pct_MS_ST_REE Silicon, as silicon dioxide, in weight percent, by inductively coupled plasma-mass spectroscopy after Na2O2 sinter digestion, REE package
SiO2_pct_WDX_Fuse Silicon, as silicon dioxide, in weight percent, by wavelength-dispersive X-ray fluorescence spectroscopy after LiBO2 or LiBO2-Li2B4O7 fusion