AGDB measured parameter: Si_pct_WDX_Fuse

Silicon, in weight percent, by wavelength-dispersive X-ray fluorescence spectroscopy after LiBO2 or LiBO2-Li2B4O7 fusion

Reference for the analytical method

Author Taggart, Joseph E., editor
Year 2002
Title Analytical methods for chemical analysis of geologic and other materials, U.S. Geological Sur
Series U.S. Geological Survey open-file report 02-223
URL http://pubs.usgs.gov/of/2002/ofr-02-0223/
Notes Title from PDF title screen (viewed on Oct. 21, 2003). Updates Open-file report 96-525. Includes bibliographical references. Mode of access: Internet. System requirements: Adobe Acrobat Reader (available free).
Organization USGS-BGC

Other parameters measuring Si

Parameter Description
Si_pct_AES_Fuse Silicon, in weight percent, by inductively coupled plasma-atomic emission spectroscopy after LiBO2 or LiBO2-Li2B4O7 fusion
Si_pct_CM_Fuse Silicon, in weight percent, by spectrophotometry after NaOH or LiBO2-Li2B4O7 fusion
Si_pct_ES_Q Silicon, in weight percent, by quantitative direct-current arc emission spectrography
Si_pct_ES_SQ Silicon, in weight percent, by semi-quantitative visual 6-step or direct reader direct-current arc emission spectrography
Si_pct_GV_Fuse Silicon, in weight percent, by gravimetric classic or standard rock analysis after fusion digestion
Si_pct_WDX_Fuse Silicon, in weight percent, by wavelength-dispersive X-ray fluorescence spectroscopy after LiBO2 or LiBO2-Li2B4O7 fusion